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LCR-T5 ATmega328 Digital Transistor Tester 12864 LCD Capacity ESR Meter

$ 6.96

Availability: 51 in stock

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Product does not contain 9v battery, you must bring your own !!!
1. Using ATmega328 microcontroller.
2. 2x16-character LCD display the results.
3. One button operation, automatic shut-off.
4. Shutdown current is only 20nA, support for battery operation.
5. Low-cost version without crystal, automatic shutdown.
1.05 k version of the ATmega168 or ATmega328 software in sleep mode when no measures to reduce energy consumption.
6. Automatic detection PNP type and NPN bipolar transistors, N, P-channel MOSFET, JFET, diode, a double diode, thyristor SCR.
7. Automatic detection of pin layout.
8. Measuring current amplification factor of the bipolar transistor and the emitter threshold voltage.
9. Darlington transistor amplification factor can be identified by the high threshold voltage and high current.
10. For bipolar transistor, MOSFET protection diode test.
11. measure the threshold voltage and the gate capacitance of the MOSFET.
12. supports two resistance measurements and show the highest four numbers symbols and units.
both ends of the resistor symbol is shown connected to the tester probes number (1-3).
therefore, the potential can also be measured.
If the potentiometer is set to its end, the tester can not distinguish between the middle and end of the pin.
13. resistance measurement resolution is 0.1 ohms, the highest measured value 50 M ohms.
14. can be detected and measured a capacitor.
Maximum four numbers and units.
Values can be from 25pF (8 MHz clock, 50pF @ 1 MHz clock) for 100mF.
resolution up to 1 pF (@ 8 MHz clock).
15. can be more valuable for 2 UF capacitor equivalent series resistance (ESR) measured capacitance value.
resolution of 0.01 ohms and a two-digit numeric display.
This feature requires at least 16 K Flash ATMEGA (ATmega168 or ATmega328).
16. two diodes that can display symbols in the right direction.
Furthermore, the forward voltage drop displayed.
17. diode voltage drop detection LED is much higher than normal.
Led two detected as double diode.
18. Zener diode can be detected, if the reverse breakdown voltage is below 4.5 V. This will appear as two diodes, can only be determined by the voltage.
probe across the diode symbol is the same, in such a case, it is possible to 700mV threshold voltage close to the true recognition anode of diode!
19. **** this year to understand, do not turn on the ****
if more than three diode type parts inspection, failure to follow to establish the display number diode another message.
this will only happen if the diode is connected to all three probes and at least one diode.
In this case, it must only connect the two probes and start the measurement again, one by one.
20. Measure a single capacitance diode reverse.
Bipolar transistors also able to measure, if connecting the base and the collector or emitter.
Twenty one.
only a measure to find full-bridge connection.
twenty two.
25pF capacitor value is lower than usual undetectable, but with a diode in parallel or at least 25pF capacitor in parallel.
In this case, you have to subtract part shunt capacitance values.
twenty three.
less than 2100 ohm resistance measure inductance, if you have at least 16 K ATMEGA flash.
range from 0: 01mH 20 hours, but the accuracy is not good.
the results of the measurements show only a single connection element.
twenty-four.
test time is of about two seconds, capacitance and inductance measurements will only take a long period of time.
25. The software can be set to automatically turn off the power measurement of times before.
26. built-in self-test function with selectable clock frequency of 50Hz signal control the precision and wait for the call (ATmega168 and ATmega328).
27. of the equipment for measurement of internal resistance and optional calibration offset zero of the self-test capability of the output port (ATmega168 and ATmega328).
need a 100nF 20 uF capacitor connected to compensate for the analog comparator between pins 1 and 3 of the offset voltage.
this can reduce the measurement error over 40 uF capacitor.
with the same voltage on the capacitor internal calibration reference voltage is found to internal adjustment reference measurement ADC gain.
if the current test exceeds the holding current, the thyristor and triac it can be detected.
but some current over the semiconductor tester capable of providing the SCR trigger and current triac.
Available test current is only about 6mA!
Note that all functions have only used single-chip program memory as more ATmega168.
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If is item is defective in 12 months, you can return it to us. We will send you a new replacement after receiving the defective item.